@book{23268,
	author = {Assoufid, Lahsen, ed.},
	title = {Advances in Metrology for X-Ray and EUV Optics III},
	publisher = {SPIE},
	year = {2010},
	series = {Proceedings of SPIE; V. 7801},
	address = {Washington, USA},
	url = {https://www.spiedigitallibrary.org/conference-proceedings-of-spie/7801}
}
