TY  - BOOK
AU  - Duparré, Angela, ed.
TI  - Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II
T2  - Proceedings of SPIE; V. 5878
SN  - 9780819458834 (Print)
PY  - 2005///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/5878
ER  -