TY  - BOOK
AU  - Duparré, Angela, ed.
TI  - Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies
T2  - Proceedings of SPIE; V. 5188
SN  - 9780819450616 (Print)
PY  - 2003///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/5188
ER  -