Duparré, Angela, ed. <br/><br/>
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies  [eBook] 

 - Washington, USA  SPIE  2003 
 - Online resource 
 - Proceedings of SPIE; V. 5188 .
<br/><br/><label>ISBN: </label>9780819450616 (Print)