TY  - BOOK
AU  - Duparré, Angela, ed.
TI  - Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components
T2  - Proceedings of SPIE; V. 4779
SN  - 9780819445469 (Print)
PY  - 2002///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/4779
ER  -