@book{22993,
	author = {Duparré, Angela, ed.},
	title = {Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components},
	publisher = {SPIE},
	year = {2002},
	series = {Proceedings of SPIE; V. 4779},
	address = {Washington, USA},
	url = {https://www.spiedigitallibrary.org/conference-proceedings-of-spie/4779}
}