TY  - BOOK
AU  - Qian, Shinan, ed.
TI  - 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics
T2  - Proceedings of SPIE; V. 9687
SN  - 9781628419221 (Print)
PY  - 2016///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/9687
ER  -