Qian, Shinan, ed. <br/><br/>
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics  [eBook] 

 - Washington, USA  SPIE  2016 
 - Online resource 
 - Proceedings of SPIE; V. 9687 .
<br/><br/><label>ISBN: </label>9781628419221 (Print)