TY  - BOOK
AU  - Ye, Tianchun, ed.
TI  - 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems
T2  - Proceedings of SPIE; V. 7657
SN  - 9780819480873 (Print)
PY  - 2010///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/7657
ER  -