TY  - BOOK
AU  - Han, Sen, ed.
TI  - 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems
T2  - Proceedings of SPIE; V. 6724
SN  - 9780819468819 (Print)
PY  - 2007///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/6724
ER  -