TY  - BOOK
AU  - Hou, Xun, ed.
TI  - 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
T2  - Proceedings of SPIE; V. 6150
SN  - 9780819461896 (Print)
PY  - 2006///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/6150
ER  -