TY  - BOOK
AU  - Zhu, Jigui, ed.
TI  - 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
T2  - Proceedings of SPIE; V. 11439
SN  - 9781510636569 (Print)
PY  - 2020///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/11439
ER  -