TY  - BOOK
AU  - Ye, Shenghua, ed.
TI  - 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications
T2  - Proceedings of SPIE; V. 7160
SN  - 9780819474049 (Print)
PY  - 2009///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/7160
ER  -