Alford, Terry L. <br/><br/>
Fundamentals of nanoscale film analysis 
Terry L. Alford, Leonard C. Feldman and James W. Mayer                                              
 - New York  Springer  2007 
 - xiv, 336p. 
<br/><br/><label>ISBN: </label>978-0-387-29260-1 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Atomic physics<br/>Electron diffraction<br/>Electron interactions<br/>Radiative transitions
<br/><br/><label>Universal Decimal Class. No.: </label>539.1  / ALF