TY  - BOOK
AU  - Goldstein, Joseph I.
AU  - Echlin, P.
AU  - Joy, D. C.
AU  - Lyman, C. E.
AU  - Newbury, D. E.
TI  - Scanning electron microscopy and X-ray microanalysis
SN  - 978-0-306-47292-3
PY  - 2007///
CY  - New York
PB  - Springer
KW  - Electron microscopy
KW  - Electron rays
KW  - Qualitative X-ray analysis
KW  - X-ray microanalysis
ER  -