00890nam a2200217Ia 4500003000900000008004100009020001800050040001600068080002500084110005000109111010000159245017600259260007900435300001300514490003700527650001300564650003500577650001300612650002100625700002600646IN-BaIIA211028s9999    xx            000 0 eng d  a0-8194-4067-1  cIIA Library  a535(082.1)bSPI-4372  aInternational Society for Optical Engineering  aSociety of Photo-Optical Instrumentation Engineers ConferencecOrlando, U.S.A.d2001 Apr. 18-19 0aInfrared imaging systemsbdesign, analysis, modeling, and testing XII; proceedings of SPIE conference held in Orlando, U.S.A., April 18-19, 2001cedited by Gerald C. Holst  aWashington, D. C.bThe International Society for Optical Engineeringc2001  av, 216p.  aSPIE proceedings series; v. 4372  aModeling  aMultispectral image processing  aSampling  aTarget detection  aHolst, Gerald C., ed.