Fringe pattern analysis  proceedings of the SPIE held in Sandiago, California, on 08-09 August 1989 
edited by Graeme T. Reid                                      
 - Washington  Society of Photo-Optical Instrumentation Engineers  1989 
 - vi, 260p. 
 - SPIE proceedings series; v. 1163 .
<br/><br/><label>ISBN: </label>0-8194-0199-4 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Astronomy and Astrophysics Thesaurus<br/>Fringe pattern<br/>Image processing techniques
<br/><br/><label>Universal Decimal Class. No.: </label>535(082.1)  / SPI-1163