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Metrology proceedings of the SPIE held in Los Angeles, California, on 15-16 February 1987 edited by BruceTruax

By:

Society of Photo-Optical Instrumentation Engineers Conference California 1987 Feb. 15-16

Contributor(s):

Truax, Bruce., ed

Material type: Text

Text

TextSeries: SPIE proceedings series; v. 749Publication details: Washington Society of Photo-Optical Instrumentation Engineers 1987Description: vi, 126pISBN:

0-89252-784-6

Subject(s):

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Item type	Current library	Shelving location	Call number	Status	Date due	Barcode
Books	IIA Library-Bangalore	General Stacks	535(082.1)/ SPI-749 (Browse shelf(Opens below))	Available		11002

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